探針座/探針卡方案

•    Applications
1.    Temperature characteristics tests in range from +20℃to +300℃
2.    Ultra low signal I=-V measurements (100fA level)
3.   Various C-V measurements (quasi-static C-V, HF-CV, and RF-CV)
4.   RF measurements (up to 67GHz)
5.    Ultra high-speed I-V measurements

•    Extend Application
1.    High-power device measurements (200A pulse, ±3kV triaxial, ±10kV coaxial)
2.   Wafer level reliability tests (such as EM, TDDB, HCI, NBTI, and BT)
3.   Probe card support (support Multi-siteWLR)
4.   Built-in laser cutter(Point making, Exfoliation of protection layer, Metal layer cutting)
5.   Active vibration isolator and ultra high-accuracy probing through image processing pattern recognition (accuracy: ±1 um or finer)
6.   Light-receiving/emitting characteristics evaluation applications for optoelectronics (such as LED, LD, VCSEL, and PD)
7.   Common gate pad contacts of flat-panel display devices

針對On-wafer 測試,克達科技提供您完整測試方案從手動、半自動到全自動等,探針/探針卡全面性的解決方案
1. Manual
2. Semi-Auto
3. Fully-Auto